中国空间科学技术

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应用于实时系统中存储器故障测试的一种新方法

杨孟飞;孙增圻;龚健;   

  1. 清华大学,清华大学,北京控制工程研究所 北京100084,北京控制工程研究所,北京100080,北京100084,北京100080
  • 发布日期:2005-12-25

A Method for Memory Fault Test in Real-time Systems

Yang Mengfei~(1,2)Sun Zengqi~(1)Gong Jian~2(1 Tsinghua University,Beijing 100084)(2 Beijing Institute of Control Engineering,Beijing 100080)   

  • Online:2005-12-25

被引次数

1

摘要： 针对实时存储器系统的常见故障类型提出了一种新的存储器测试方法,其最大特点是在测试过程中不使用缓冲区,从而节省了系统资源,增加了测试覆盖率;同时证明了该存储器测试方法的正确性。

关键词: 存储器, 故障检测, 方法

Abstract: A new memory test method according to fault models in real-time memory systems is presented.The main feature of this test method is that buffers are not used in the process of(testing),so that system resources are saved and test coverage rate is improved.The correctness of this memory test method is also proved.