›› 2017, Vol. 37 ›› Issue (2): 39-47.doi: 10.16708/j.cnki.1000-758X.2017.0038

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Dynamiccharacteristicsofsecondaryelectronemissionofdielectricmaterials

 ZHANG  Xiu-Sheng, CAO  Meng*, WENG  Ming, WANG  Fang   

  1. KeyLaboratoryforPhysicalElectronicsandDevicesoftheMinistryofEducation,Xi ′anJiaotongUniversity,Xi′an710049,  China
  • Received:2016-08-31 Revised:2017-02-21 Published:2017-04-25 Online:2017-03-21

Abstract: Theresearchondynamiccharacteristicsofdielectricmaterialsis animportantpartinthefieldofsecondaryelectronemission.Bynumericalsimulationmethod,amod eloftheeffectivesecondaryelectroncollectionefficiencywasestablished andtheeffectsofmeasuringparametersonthedynamiccharacteristicswerestudied.Theresultsshow thatspaceelectricfieldandcollectorstructurehassomecorrelationontheeffectivesecondarye lectroncollectorefficiency.Theincreaseofcollectorpotentialcanimprovetheeffectivesecondary electroncollectionefficiencyandthehalfwidthtimeofthedynamicprocesswillincreaselinearly. Inaddition,thecollectorstructurecanaffectthespaceelectricfield.Bydirectlyinfluencingthe collectionefficiency,spaceelectricfieldandcollectorstructureindirectlychangethesurfacecha rgetocausethechangeofdynamiccharacteristics.Theincidentbeamcandirectlyaffectthesurfac echargeaccumulationandmakesthehalfwidthtimeincrease ordecrease.Theresultshaveimportantscientificsignificanceforrevealingthedynamicprocessofch argedmaterialandpredictingtheexperimentthataccuratelymeasuringthesecondaryelectronemission coefficients.

Key words: secondaryelectron, numericalsimualtion, dielectricmaterial, dynamiccharacteristic, chargeaccumulation