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Du Wenzhi Tan Weichi (Beijing Institute of Spacecraft System Engineering, Beijing 100086)
Online:
Abstract: Mechanism of defects clustering in IC and its influence on manufacturing yield of IC are analyzed in this paper. The influence of defects clustering in FPGA on the reliability of inside fault-tolerance circuit with redundancy is also discussed by using prediction model of manufacturing yield of IC. Hereby strategies of improving its reliability are presented, model for analyzing its reliability is set up and some guidance principles about how to lay are provided.
Du Wenzhi Tan Weichi (Beijing Institute of Spacecraft System Engineering, Beijing 100086). Research on Design of Circuit Reliability in FPGA with Defect Clustering[J]. .
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URL: http://journal26.magtechjournal.com/kjkxjs/EN/
http://journal26.magtechjournal.com/kjkxjs/EN/Y2004/V24/I02/
