中国空间科学技术

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80C31 SEU SENSITIVITY EVALUATION

Tang Min; Zhao Dapeng; Meng Qingru; Wu Zhiyu; Yu Qingkui (Beijing Institute of Satellite Environment Engineering, Beijing 100029)Lan Zengrui(Shanghai Institute of Spacecraft Engineering, Shanghai 200240)Cheng Ertong;Luan Binghui(Shanghai Institute of Tech   

  • Published:1996-04-25

Abstract: Microcontroller 80C31 single event upset (SEU) sensitivity evaluation test is performed by using heavy ions from Tandem Van-de Graff accelerator.According to the error cross section versus LET curve, bit upset rate of 80C31 on geosynchronous orbit is estimated.