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MECHANISM TEST AND PREDICTION OF EFFECTS OF SINGLE EVENT ON SEMICONDUCTOR DEVICE

Meng Qingru Zhao Dapeng Bao Bairong (Beijing Institute of Satellite Environment Engineering)   

  • Published:1993-08-25

Abstract: The space highly-energetic-particle environment and themechanism,test and prediction of the effects induced by a single particleare introduced.The space particle environment is composed of galactic co-smic rays,solar flares and geomagnetically-trapped particles.Energeticparticles penetrating into semiconductor devices can cause single eventphenomena including SEU,SEL and SEB The available test facilities include Cali fornium-252,Van de Graff accelerator and cyclotron.Peter-son's experimental formula or program CREME can be used to predictthe error rate under a certain environmental condition.