中国空间科学技术
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谭维炽
发布日期:
Tan Weizhi (Beijing Institute of Spacecraft Systems Engineering)
Online:
摘要: 介绍了一种以FTA和FMEA联合进行电路失效分析的方法,并在此基础上做可靠性设计,有效提高了星上电子设备的可靠性。文中有具体的步骤和实例,可供设计人员参照采用。
关键词: 可靠性设计, 失效分析, 冗余设计
Abstract: This paper introduces a FTA-FMEA joint method for the ana-lysis of electronic clrcuits.The reliability design is carried out based on thismethod,therefore the reliability of the electronic equipment on board space-craft is increased effectively.The method and the examples presented in thispaper arc of reference value for electronic system designers.
谭维炽. 用FTA-FMEA联合法做电子设备可靠性设计[J]. 中国空间科学技术.
Tan Weizhi (Beijing Institute of Spacecraft Systems Engineering). RELIABILITY DESIGN OF ELECTRONIC EQUIPMENT BASED ON COMBINATION FTA—FMEA[J]. Chinese Space Science and Technology.
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链接本文: https://journal26.magtechjournal.com/kjkxjs/CN/
https://journal26.magtechjournal.com/kjkxjs/CN/Y1991/V11/I05/41