Abstract: Based on a few hundreds failure analysis reports completedwithin the period of 1987 to 1990 by Electronic Components ReliabilityCenter,CAST,MAS,a number of distribution patterns of pre—dissectionfailure modes and failure mechanisms for satellite—borne semiconductordevices have been obtained. The relevant percentages for failure modes are:logic out of control 36.3%,open circuit 22.2%,ect. The relevant percenta-ges for failure mechanisms are:aluminium corrosion 16.3%,mi(?)use 14.6%,ect.For the first time this work points out entirely and systematically thefailure modes and failure mechanisms for satellite—borne devices,wherebyprovides important basis for taking measures in satellite reliability designand optimally selecting devices and manufacturers.

Key words: Satellite, Semicondutor device, Failure mode, Failure mechanism, Reliability