Chinese Space Science and Technology
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Yang Mengfei~(1,2)Sun Zengqi~(1)Gong Jian~2(1 Tsinghua University,Beijing 100084)(2 Beijing Institute of Control Engineering,Beijing 100080)
Online:
Abstract: A new memory test method according to fault models in real-time memory systems is presented.The main feature of this test method is that buffers are not used in the process of(testing),so that system resources are saved and test coverage rate is improved.The correctness of this memory test method is also proved.
Yang Mengfei~(1,2)Sun Zengqi~(1)Gong Jian~2(1 Tsinghua University,Beijing 100084)(2 Beijing Institute of Control Engineering,Beijing 100080). A Method for Memory Fault Test in Real-time Systems[J]. Chinese Space Science and Technology.
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URL: https://journal26.magtechjournal.com/kjkxjs/EN/
https://journal26.magtechjournal.com/kjkxjs/EN/Y2005/V25/I06/26
