Source analysis of multipactor-induced low-pressure gas of microwave component in spacecraft

doi:10.16708/j.cnki.1000-758X.2023.0051

Abstract

Abstract: The low-pressure discharge effect of microwave components is a special effect threatening the safety of space electronic components.The low pressure environment inside the component after the desorption of the adsorbed gas from the component material provides the necessary conditions for low pressure discharge.Firstly，the difference between the multipactor and the low-pressure discharge was compared，and the root cause of the destructive effect of low-pressure discharge was described.Through theoretical analysis and calculation，the desorption efficiencies of thermal and electron bombardment effects on adsorbed gases with different bond energies were compared.It is found that thermogenic desorption mainly causes the desorption of physiosorbed gases with low bond energy，and that the electron bombardment effect can cause the desorption of chemisorbed gases with high bond energy.It was elucidated that electron-induced desorption processes caused by secondary electron multiplication are the main reason for the formation of the low-pressure environment inside the on-board microwave components.Finally，the method of suppressing the low-pressure discharge effect by surface treatment of component materials and increasing the threshold of secondary electron multiplication is discussed.

Key words: low-pressure discharge, absorbed gas, thermal desorption, electron induced desorption, plasma, multipactor

CHEN Zeyu, WANG Rui, CUI Wanzhao. Source analysis of multipactor-induced low-pressure gas of microwave component in spacecraft[J]. Chinese Space Science and Technology, 2023, 43(4): 35-42.

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URL: https://journal26.magtechjournal.com/kjkxjs/EN/10.16708/j.cnki.1000-758X.2023.0051

https://journal26.magtechjournal.com/kjkxjs/EN/Y2023/V43/I4/35

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Source analysis of multipactor-induced low-pressure gas of microwave component in spacecraft

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