Abstract: In this paper,using Single Event Upset (SEU) data collected by high speed static RAM IDT71256D and asynchronous static RAM HM8832 of SEU Monitor on board SJ 4 spacecraft,the total upset rate,the device type and the logic upset rates are obtained and compared with other space experiment results.In addition,the SEU distribution histograms and fit exponential decay curves for the differences of SEU address on chip and arrive time are given by statistic analysis based on portion of SEU data,and finally the conclusions are given.