Abstract: Anaccuratemodelforsecondaryelectronyield（SEY）isofgreatimportanceforthecalculationofmultipactorthreshold,buttheexistingSEYmodelis deficientinsatisfyingtheneedsofaccuracyandconcisenessatthesametime.AnanalyticalmodelforSEYofmetalswaspresentedbyanalyzingtheescapingprobabilityofsecondaryelectronscombinedwiththemodifiedBetheenergylossequation.Furthermore,SEYmodelsforuncleanedandArion cleanedAgsampleswereobtainedbyfittingtheexperimentalresultswiththeanalyticalmodel.CalculationresultsshowthatthestandarddeviationbetweenSEYmodelsandexperimentalresultsofuncleanedandArioncleanedAgiswithin4%atdifferentincidentangles,whichindicatesthattheanalyticalmodelpresentedcanbeusedtoestablishtheaccurateSEYmodelofmetalsandcalculatemultipactorthresholdofspacehighpowermicrowavecomponentanddensityofelectroncloudinaccelerator.

Key words: secondaryelectronyield, spacehighpowermicrowavecomponent, analyticalmodel, metalsurface, energyloss